さまざまな種類のエネルギー貯蔵材料の研究需要に応えるため、Sun研究者のグループは2021年10月、CIQTEKが独自に開発したタングステンフィラメント走査型電子顕微鏡(SEM)を導入した。走査型電子顕微鏡は材料科学における重要な研究ツールであり、主に材料の構造、形態、組成、特性、故障解析の研究に適用されることが理解されています。現在、CIQTEK SEM を使用して研究所がテストした材料には、活性炭、金属酸化物、ソフトカーボン、ハードカーボン、およびその他の電極材料が含まれます。同時に、このグループは SEM を使用して、スーパーキャパシタとバッテリーモノマーの故障の原因を分析しています。
「以前の電子顕微鏡では、サンプルを選択する前に携帯電話で写真を撮ってサンプルの位置を記憶する必要がありました。CIQTEKの走査型電子顕微鏡には光学ナビゲーション機能があり、サンプルを入れた後、非常に直感的に見つけることができます。過去の電子顕微鏡と比較して、CIQTEKの走査型電子顕微鏡の最大の特徴は、便利な操作性と高度な自動化であり、すべての操作はマウスのポイントとクリックだけで完了でき、マウスやノブを操作する必要はありません。サンプルを移動したり、サンプルを選択したりするのに便利で、非常に簡単に始めることができます。」CIQTEK SEM の使用経験について、研究者の Sun 氏は次の例を挙げました。
Analytical Schottky Field Emission Scanning Electron Microscope (FESEM) CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.
High Resolution under Low Excitation The CIQTEK SEM5000Pro is a high-resolution Schottky field emission scanning electron microscope (FE-SEM) specialized in high resolution even under low excitation voltage. Employing an advanced "Super-Tunnel" electron optics technology facilitates a crossover-free beam path and an electrostatic-electromagnetic compound lens design. These advancements reduce spatial charging effect, minimize lens aberrations, enhance imaging resolution at low voltage, and achieve a resolution of 1.2 nm at 1 kV, which allows for direct observation of non-conductive or semi-conductive samples, effectively reducing sample irradiation damage.
High-performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.
Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).
Stable, Versatile, Flexible, and Efficient The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.